R-PROBE
High-Performance Rugged Probes for RF & SI Probing
R-Probe series is designed for power integrity and RF testing. Narrow BeCu tips are ideal for probing on hard-to-reach test pads surrounded by components.
HIGHLIGHTS
- High Bandwidth: DC to 18 GHz
- Low Insertion Loss: < 3 dB @ Bandwidth
- Ruggedness: Strong, narrow BeCu tips
- High Repeatability: Precision-engineered tips for direct probing on hard-to-reach test pads surrounded by components
- Probe-tip Calibration: accurate measurements without the need of soldering semi-rigid RF cables
- User experience similar to that of a microprobe
Specifications
Bandwidth
18 GHz (0.2/0.3 mm pitch) 15 GHz (0.4/0.5 mm pitch) 12 GHz (0.8/1.0 mm pitch)
Insertion Loss
< 3 dB @ Bandwidth
Impedance
50±2 Ohm
Connector Type
SMA Female
Dimensions (LxWxH)
38 x 20 x12 mm (1.5x0.8x0.5")
Weight
8 gm
Probe Force
50 gm (typical), 200 gm (Max w/o damage)
S21 Measurement
Un-calibrated S21 for 0.3/0.5/1.0 mm pitch
PART NO.
BW (GHz)
PROBE PITCH
RP-GR-181502
18 GHz
0.2 mm / 8 mil
RP-GR-181503
18 GHz
0.3 mm / 12 mil
RP-GR-151504
15 GHz
0.4 mm / 16 mil
RP-GR-151505
15 GHz
0.5 mm / 20 mil
RP-GR-151506
15 GHz
0.6 mm / 24 mil
RP-GR-121508
12 GHz
0.8 mm / 32 mil
RP-GR-121510
12 GHz
1.0 mm / 40 mil
S11 Measurement
Un-calibrated S11 for 0.3/0.5/1.0 mm pitch
PROBE PITCH VS. COMPONENT SIZE
PROBE PART NO.
SIZE
RP-GR-181503
01005
RP-GR-151505
0201
RP-GR-121510
0402
Accessories
TCS50
CALIBRATION SUBSTRATE
R-Probe product family includes a TCS50 calibration substrate with short, open, load, and thru (SOLT) standards for S-parameter calibrations. This substrate enables a user to move the measurement reference point directly to the probe tips for accurate, repetitive testing.
TP250 Precision Positioner
A precision positioner works with all PacketMicro's DIY probing fixtures.
TP150 Precision Positioner
A low-cost positioner is good for simple, standalone probing measurements.
Applications
RF MEASUREMENT
The rugged R-Probes can be used to measure the S21/S11 between socket pin and antenna connector.
Check out our other Probes
S-PROBE
S-Probe series is designed for RF, signal integrity, and power integrity testing of printed-circuit boards.
D-PROBE
D-Probe series is designed for signal integrity, and RF testing. Its strong beryllium copper (BeCu) tips make the D-Probe ideal for manufacturing testing of highspeed printed-circuit boards.
